Parent Category: Rocktabs Archive

PXI-based ATE

NI announced the NI Semiconductor Test System (STS) series. These PXI-based automated test systems reduce test cost for RF and mixed-signal devices by opening access to NI- and industry-offered PXI modules in semiconductor production test environments. STS lead users are experiencing reduced production costs and increased throughput and can now perform both characterization and production with the same hardware and software tools.

National Instruments
ni.com